• DocumentCode
    2118633
  • Title

    Variance estimation using replicated batch means

  • Author

    Andradttir, S. ; Argon, Nilay Tanik

  • Author_Institution
    Sch. of Ind. & Syst. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    1
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    338
  • Abstract
    We present a new method for obtaining confidence intervals in steady-state simulation. In our replicated batch means method, we perform a small number of independent replications to estimate the steady-state mean of the underlying stochastic process. In order to obtain a variance estimator, we further group the observations from these replications into nonoverlapping batches. We show that for large sample sizes, the new variance estimator is less biased than the batch means variance estimator, the variances of the two variance estimators are approximately equal, and the new steady-state mean estimator has a smaller variance than the batch means estimator when there is positive serial correlation between the observations. For small sample sizes, we compare our replicated batch means method with the (standard) batch means and multiple replications methods empirically, and show that the best overall coverage of confidence intervals is obtained by the replicated batch means method with a small number of replications
  • Keywords
    simulation; statistical analysis; stochastic processes; confidence intervals; independent replications; large sample sizes; nonoverlapping batches; positive serial correlation; replicated batch means method; steady-state mean; steady-state simulation; stochastic process; variance estimation; variance estimator; Argon; Discrete event simulation; Modeling; Parameter estimation; Steady-state; Stochastic processes; Systems engineering and theory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2001. Proceedings of the Winter
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-7307-3
  • Type

    conf

  • DOI
    10.1109/WSC.2001.977297
  • Filename
    977297