Title :
Investigation of Si IGBT operation at 200 °C for traction application
Author :
Xu, Zhuxian ; Li, Ming ; Wang, Fred ; Liang, Zhenxian
Author_Institution :
Electr. Eng. & Comput. Sci. Dept., Univ. of Tennessee, Knoxville, TN, USA
Abstract :
In order to satisfy the high density requirement and harsh thermal conditions in future hybrid vehicles, a systematic study of Si IGBT operating at 200°C is performed to determine its feasibility, issues and application guideline. First, the device forward conduction characteristics, leakage current, and switching performance at various temperatures are evaluated through both analytical and lab evaluation. Based on the device characterization, the loss and thermal study is then performed, which provides the guideline for packaging and cooling design. Finally, the possible failure mechanisms at high temperatures including latching and short circuit fault have been tested to ensure the safe and reliable operation of Si IGBTs.
Keywords :
cooling; elemental semiconductors; failure analysis; hybrid electric vehicles; insulated gate bipolar transistors; leakage currents; semiconductor device packaging; short-circuit currents; silicon; traction; IGBT operation; Si; cooling design; device forward conduction characteristics; electronics packaging; failure mechanisms; hybrid vehicles; leakage current; short circuit fault; temperature 200 degC; Insulated gate bipolar transistors; Junctions; Leakage current; Semiconductor optical amplifiers; Silicon; Switches; Temperature; Trench-gate field-stop silicon IGBT; high temperature characteristics; safe operating area; traction application;
Conference_Titel :
Energy Conversion Congress and Exposition (ECCE), 2011 IEEE
Conference_Location :
Phoenix, AZ
Print_ISBN :
978-1-4577-0542-7
DOI :
10.1109/ECCE.2011.6064087