• DocumentCode
    2119191
  • Title

    Non-ideal iris segmentation using graph cuts

  • Author

    Pundlik, Shrinivas J. ; Woodard, Damon L. ; Birchfield, Stanley T.

  • Author_Institution
    Electr. & Comput. Eng. Dept., Clemson Univ., Clemson, SC
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    A non-ideal iris segmentation approach using graph cuts is presented. Unlike many existing algorithms for iris localization which extensively utilize eye geometry, the proposed approach is predominantly based on image intensities. In a step-wise procedure, first eyelashes are segmented from the input images using image texture, then the iris is segmented using grayscale information, followed by a post-processing step that utilizes eye geometry to refine the results. A preprocessing step removes specular reflections in the iris, and image gradients in a pixel neighborhood are used to compute texture. The image is modeled as a Markov random field, and a graph cut based energy minimization algorithm [2] is used to separate textured and untextured regions for eyelash segmentation, as well as to segment the pupil, iris, and background using pixel intensity values. The algorithm is automatic, unsupervised, and efficient at producing smooth segmentation regions on many non-ideal iris images. A comparison of the estimated iris region parameters with the ground truth data is provided.
  • Keywords
    Markov processes; graph theory; image recognition; image segmentation; minimisation; Markov random field; energy minimization; eye geometry; eyelash segmentation; graph cuts; grayscale information; image gradients; image intensities; image texture; input images; iris localization; iris region parameters; nonideal iris segmentation; pixel intensity values; pixel neighborhood; post-processing step; smooth segmentation region; specular reflection; Eyelashes; Gray-scale; Image segmentation; Image texture; Information geometry; Iris; Markov random fields; Minimization methods; Pixel; Reflection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-2339-2
  • Electronic_ISBN
    2160-7508
  • Type

    conf

  • DOI
    10.1109/CVPRW.2008.4563108
  • Filename
    4563108