DocumentCode
2119191
Title
Non-ideal iris segmentation using graph cuts
Author
Pundlik, Shrinivas J. ; Woodard, Damon L. ; Birchfield, Stanley T.
Author_Institution
Electr. & Comput. Eng. Dept., Clemson Univ., Clemson, SC
fYear
2008
fDate
23-28 June 2008
Firstpage
1
Lastpage
6
Abstract
A non-ideal iris segmentation approach using graph cuts is presented. Unlike many existing algorithms for iris localization which extensively utilize eye geometry, the proposed approach is predominantly based on image intensities. In a step-wise procedure, first eyelashes are segmented from the input images using image texture, then the iris is segmented using grayscale information, followed by a post-processing step that utilizes eye geometry to refine the results. A preprocessing step removes specular reflections in the iris, and image gradients in a pixel neighborhood are used to compute texture. The image is modeled as a Markov random field, and a graph cut based energy minimization algorithm [2] is used to separate textured and untextured regions for eyelash segmentation, as well as to segment the pupil, iris, and background using pixel intensity values. The algorithm is automatic, unsupervised, and efficient at producing smooth segmentation regions on many non-ideal iris images. A comparison of the estimated iris region parameters with the ground truth data is provided.
Keywords
Markov processes; graph theory; image recognition; image segmentation; minimisation; Markov random field; energy minimization; eye geometry; eyelash segmentation; graph cuts; grayscale information; image gradients; image intensities; image texture; input images; iris localization; iris region parameters; nonideal iris segmentation; pixel intensity values; pixel neighborhood; post-processing step; smooth segmentation region; specular reflection; Eyelashes; Gray-scale; Image segmentation; Image texture; Information geometry; Iris; Markov random fields; Minimization methods; Pixel; Reflection;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on
Conference_Location
Anchorage, AK
ISSN
2160-7508
Print_ISBN
978-1-4244-2339-2
Electronic_ISBN
2160-7508
Type
conf
DOI
10.1109/CVPRW.2008.4563108
Filename
4563108
Link To Document