DocumentCode :
2119431
Title :
Circuit demonstration of radiation hardened chalcogenide non-volatile memory
Author :
Maimon, J. ; Hunt, K. ; Rodgers, J. ; Burcin, L. ; Knowles, K.
Author_Institution :
Ovonyx, Inc.
Volume :
5
fYear :
2003
fDate :
March 8-15, 2003
Keywords :
Amorphous materials; CMOS technology; Circuit testing; Electrons; Germanium alloys; Nonvolatile memory; Phase change materials; Radiation hardening; System testing; Temperature dependence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2003. Proceedings. 2003 IEEE
ISSN :
1095-323X
Print_ISBN :
0-7803-7651-X
Type :
conf
DOI :
10.1109/AERO.2003.1235161
Filename :
1235161
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2119431
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