Title :
A New Consistent Description Of MOSFET Performance For Circuit Simulation
Author :
Miura-Mattausch, M. ; Bergner, W.
Author_Institution :
Siemens AG
Keywords :
Analytical models; Capacitance; Character generation; Circuit simulation; Current measurement; Educational institutions; MOSFET circuits; Predictive models; Research and development; Voltage;
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
DOI :
10.1109/VPAD.1993.724756