• DocumentCode
    2119718
  • Title

    3D face econstruction from a single 2D face image

  • Author

    Park, Sung Won ; Heo, Jingu ; Savvides, Marios

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
  • fYear
    2008
  • fDate
    23-28 June 2008
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    T3D face reconstruction from a single 2D image is mathematically ill-posed. However, to solve ill-posed problems in the area of computer vision, a variety of methods has been proposed; some of the solutions are to estimate latent information or to apply model based approaches. In this paper, we propose a novel method to reconstruct a 3D face from a single 2D face image based on pose estimation and a deformable model of 3D face shape. For 3D face reconstruction from a single 2D face image, it is the first task to estimate the depth lost by 2D projection of 3D faces. Applying the EM algorithm to facial landmarks in a 2D image, we propose a pose estimation algorithm to infer the pose parameters of rotation, scaling, and translation. After estimating the pose, much denser points are interpolated between the landmark points by a 3D deformable model and barycentric coordinates. As opposed to previous literature, our method can locate facial feature points automatically in a 2D facial image. Moreover, we also show that the proposed method for pose estimation can be successfully applied to 3D face reconstruction. Experiments demonstrate that our approach can produce reliable results for reconstructing photorealistic 3D faces.
  • Keywords
    computer vision; face recognition; image reconstruction; pose estimation; 2D face image; 3D deformable model; 3D face construction; barycentric coordinates; computer vision; pose estimation; Computer vision; Deformable models; Detectors; Face detection; Facial features; Image reconstruction; Interference; Parameter estimation; Probability; Shape;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision and Pattern Recognition Workshops, 2008. CVPRW '08. IEEE Computer Society Conference on
  • Conference_Location
    Anchorage, AK
  • ISSN
    2160-7508
  • Print_ISBN
    978-1-4244-2339-2
  • Electronic_ISBN
    2160-7508
  • Type

    conf

  • DOI
    10.1109/CVPRW.2008.4563127
  • Filename
    4563127