DocumentCode :
2119996
Title :
Failure diagnosis of integrated circuits using ir laser images
Author :
Keenan, E. ; Wright, R.G. ; Kirkland, Larry V.
Author_Institution :
GMA Industries, Inc.
Volume :
6
fYear :
2003
fDate :
March 8-15, 2003
Keywords :
Charge coupled devices; Charge-coupled image sensors; Circuit testing; Fixtures; Image analysis; Infrared detectors; Integrated circuit testing; Laser theory; Laser tuning; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2003. Proceedings. 2003 IEEE
ISSN :
1095-323X
Print_ISBN :
0-7803-7651-X
Type :
conf
DOI :
10.1109/AERO.2003.1235182
Filename :
1235182
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2119996
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