• DocumentCode
    2120008
  • Title

    RF breakdown test of SiO2 coated copper electrodes

  • Author

    Sun, D. ; Datte, P. ; MacKay, W.W. ; Huson, F.R.

  • Author_Institution
    Texas Accel. Center, The Woodlands, TX, USA
  • fYear
    1991
  • fDate
    6-9 May 1991
  • Firstpage
    736
  • Abstract
    RF breakdown test results with copper and SiO/sub 2/-coated copper are presented. The interest was to investigate what improvement could be made in depressing the field emission and increasing the maximum field gradient by the SiO/sub 2/ coating. The results show that the breakdown started at a field level of 97-100 MV/m with the SiO/sub 2/-coated electrodes. The Kilpatrick limit at 471 MHz is 20 MV/m. This means that SiO/sub 2/ coating may provide a method for keeping the electrode surface free of damage during high field gradient operation. The SiO/sub 2/ coating can also reduce the field emission. Compared with the pure copper electrodes which were used for more than 100 h, the data show that the total normalized X-ray counts of the pure copper sample were about 20 times more than that of SiO/sub 2/-coated copper.<>
  • Keywords
    copper; electric breakdown of solids; electrodes; electron field emission; silicon compounds; 471 MHz; Kilpatrick limit; RF breakdown test; SiO/sub 2/-Cu; electrode surface; field emission; high field gradient operation; maximum field gradient; normalized X-ray counts; Copper; Electric breakdown; Electrodes; Electron emission; Monitoring; Radio frequency; Sparks; Spectroscopy; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Particle Accelerator Conference, 1991. Accelerator Science and Technology., Conference Record of the 1991 IEEE
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-7803-0135-8
  • Type

    conf

  • DOI
    10.1109/PAC.1991.164424
  • Filename
    164424