• DocumentCode
    2120865
  • Title

    Silicon Laser Annealing by a Two-Pulse Laser System with Variable Pulse Offsets

  • Author

    Gonda, V. ; Slabbekoorn, J. ; Nanver, L.K.

  • Author_Institution
    Delft Univ. of Technol., Delft
  • fYear
    2007
  • fDate
    2-5 Oct. 2007
  • Firstpage
    257
  • Lastpage
    261
  • Abstract
    Double-pulsed high-power excimer laser annealing is investigated for use as a means of implanted dopant activation. The laser setup incorporates two lasers that allow double pulse laser annealing with pulse offsets much smaller than the repetition of the individual XeCl excimer lasers. In this configuration, the pulse offset can be fine tuned. Sheet resistances are measured and thermal simulations are conducted to study temperature profiles. Results show, that the total laser energy needed for a complete activation increases with the pulse separation. The increase can be compensated by substrate heating. In this way the thermal budget can be tuned with more freedom.
  • Keywords
    elemental semiconductors; laser beam annealing; semiconductor doping; sheet materials; silicon; Si:As; Si:As - Binary; excimer laser annealing; implanted dopant activation; sheet resistances; substrate heating; temperature profiles; thermal simulations; total laser energy; two-pulse laser system; variable pulse offsets; Annealing; Electrical resistance measurement; Laser modes; Laser tuning; Optical pulse generation; Optical pulses; Semiconductor lasers; Silicon; Solid lasers; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Thermal Processing of Semiconductors, 2007. RTP 2007. 15th International Conference on
  • Conference_Location
    Catania, Sicily
  • Print_ISBN
    978-1-4244-1228-0
  • Electronic_ISBN
    978-1-4244-1228-0
  • Type

    conf

  • DOI
    10.1109/RTP.2007.4383851
  • Filename
    4383851