• DocumentCode
    2120947
  • Title

    Lasers Solutions for Annealing

  • Author

    Turk, B. ; Paetzel, Rainer ; Brune, Jan ; Govorkov, S. ; Simon, Frank

  • Author_Institution
    Coherent Inc., Santa Clara
  • fYear
    2007
  • fDate
    2-5 Oct. 2007
  • Firstpage
    281
  • Lastpage
    289
  • Abstract
    The application of lasers for annealing of wafer-based and thin-film microelectronic devices is steadily increasing. Excellent control of material characteristics (for example, dopant activation profile) can be achieved through proper selection of laser parameters, such as wavelength, pulse duration and fluence, which directly influence the laser material interaction. In this paper, we present several lasers and optical systems from Coherent that have proven to be useful for annealing in both microelectronic and macroelectronic applications. These laser systems include Excimer Lasers in the ultraviolet and our unique high-power continuous-wave laser system that delivers scalable output power of multiple hundreds of Watts in the visible wavelength range. We will present results from recent work involving dopant activation, and will present several application examples from Flat Panel Display annealing and crystallization, which we propose are directly applicable to wafer-based microelectronics as well.
  • Keywords
    crystallisation; integrated circuit technology; laser beam annealing; annealing; crystallization; dopant activation; excimer lasers; flat panel display annealing; laser systems; lasers solutions; thin-film microelectronic devices; Annealing; Flat panel displays; Laser applications; Microelectronics; Optical control; Optical materials; Optical pulses; Power generation; Power lasers; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Thermal Processing of Semiconductors, 2007. RTP 2007. 15th International Conference on
  • Conference_Location
    Catania, Sicily
  • Print_ISBN
    978-1-4244-1228-0
  • Electronic_ISBN
    978-1-4244-1228-0
  • Type

    conf

  • DOI
    10.1109/RTP.2007.4383855
  • Filename
    4383855