Title :
MASTAR - A Model For Analog Simulation Of Subthreshold, Saturation And Weak Avalanche Regions In MOSFETs
Author :
Skotnicki, T. ; Merckel, G. ; Denat, C.
Author_Institution :
CNET-CNS
Keywords :
Accuracy; Feedback; Immune system; MOSFET circuits; Oxidation; Packaging; Predictive models; Solid modeling; Subthreshold current; Threshold voltage;
Conference_Titel :
VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
Print_ISBN :
0-7803-1338-0
DOI :
10.1109/VPAD.1993.724762
