• DocumentCode
    2121600
  • Title

    Power-on contention elimination [CMOS digital circuits]

  • Author

    Taylor, G. ; Wong, K.

  • Author_Institution
    Intel Corp., Hillsboro, OR, USA
  • fYear
    1996
  • fDate
    13-15 June 1996
  • Firstpage
    22
  • Lastpage
    23
  • Abstract
    If ignored, power-on contention will eventually become intolerable. If ignored on current processes it will lead to increased fallout at burn-in. On future processes it may lead to fallout at the normal operating supply for a chip. Fortunately, a straightforward design solution is available which permits a chip to avoid power-on contention failures. The authors describe this design solution.
  • Keywords
    CMOS digital integrated circuits; integrated circuit design; CMOS digital circuits; design solution; power-on contention elimination; CMOS digital integrated circuits; Digital circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-3339-X
  • Type

    conf

  • DOI
    10.1109/VLSIC.1996.507701
  • Filename
    507701