• DocumentCode
    2121828
  • Title

    Microhardness and elastic properties of bulk glasses and thin films of the Gex-Sb40-x-S60 family

  • Author

    Pamukchieva, V. ; Savova, E. ; Skordeva, E. ; Popescu, M. ; Sava, F. ; Lörinczi, A.

  • Author_Institution
    Inst. of Solid State Phys., Bulgarian Acad. of Sci., Sofia, Bulgaria
  • Volume
    2
  • fYear
    1996
  • fDate
    9-12 Oct 1996
  • Firstpage
    373
  • Abstract
    The microhardnesses (H) of bulk glasses and thin films in the Gex-Sb40-xS60 family has been measured. The volume of the micro-voids (Vh), their formation energy (Eh) and the module of elasticity (E) have been calculated. It is assumed that the bulk glasses and thin films have different elasticity levels due to the deformation of specific chemical bonds
  • Keywords
    chalcogenide glasses; elastic moduli; germanium compounds; microhardness; semiconductor thin films; voids (solid); GexSb40-xS60; GeSbS; bulk glass; chemical bonding; deformation; formation energy; microhardness; microvoid volume; module of elasticity; thin film; Glass; Physics; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Conference, 1996., International
  • Conference_Location
    Sinaia
  • Print_ISBN
    0-7803-3223-7
  • Type

    conf

  • DOI
    10.1109/SMICND.1996.557399
  • Filename
    557399
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2121828