Title :
Critical tools identification and characteristics curves construction in a wafer fabrication facility
Author :
Nazzal, Dima ; Mollaghasemi, Mansooreh
Author_Institution :
Sch. of Ind. Eng. & Manage. Syst., Central Florida Univ., Orlando, FL, USA
Abstract :
The purpose of this research was to identify the factors in a wafer fabrication facility that significantly affect the cycle times of two main technologies that are currently in process and in demand for the next few years. Moreover, the goal was to construct the characteristics curves that would provide information about the different capabilities of a wafer fabrication facility for several improvement scenarios. A valid simulation model of the whole production line of the fabrication facility was built. The input factors in the fab that significantly affect cycle time, were identified through factor screening experiments. Based on these factors, several scenarios involving addition of tools, were identified and the characteristics curves were constructed for each scenario. These characteristics curves were used to relate cycle time to production volume capacities
Keywords :
digital simulation; integrated circuit manufacture; semiconductor process modelling; strategic planning; characteristics curves; critical tools identification; cycle times; fabrication facility; factor screening experiments; production line; production volume capacities; simulation model; wafer fabrication facility; Electronics industry; Engineering management; Fabrication; Industrial engineering; Microelectronics; Production; Semiconductor device manufacture; Semiconductor device modeling; Time measurement; Volume measurement;
Conference_Titel :
Simulation Conference, 2001. Proceedings of the Winter
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-7307-3
DOI :
10.1109/WSC.2001.977433