• DocumentCode
    2121880
  • Title

    Critical tools identification and characteristics curves construction in a wafer fabrication facility

  • Author

    Nazzal, Dima ; Mollaghasemi, Mansooreh

  • Author_Institution
    Sch. of Ind. Eng. & Manage. Syst., Central Florida Univ., Orlando, FL, USA
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1194
  • Abstract
    The purpose of this research was to identify the factors in a wafer fabrication facility that significantly affect the cycle times of two main technologies that are currently in process and in demand for the next few years. Moreover, the goal was to construct the characteristics curves that would provide information about the different capabilities of a wafer fabrication facility for several improvement scenarios. A valid simulation model of the whole production line of the fabrication facility was built. The input factors in the fab that significantly affect cycle time, were identified through factor screening experiments. Based on these factors, several scenarios involving addition of tools, were identified and the characteristics curves were constructed for each scenario. These characteristics curves were used to relate cycle time to production volume capacities
  • Keywords
    digital simulation; integrated circuit manufacture; semiconductor process modelling; strategic planning; characteristics curves; critical tools identification; cycle times; fabrication facility; factor screening experiments; production line; production volume capacities; simulation model; wafer fabrication facility; Electronics industry; Engineering management; Fabrication; Industrial engineering; Microelectronics; Production; Semiconductor device manufacture; Semiconductor device modeling; Time measurement; Volume measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2001. Proceedings of the Winter
  • Conference_Location
    Arlington, VA
  • Print_ISBN
    0-7803-7307-3
  • Type

    conf

  • DOI
    10.1109/WSC.2001.977433
  • Filename
    977433