DocumentCode :
2121922
Title :
Scheduling setup changes at bottleneck facilities in semiconductor manufacturing
Author :
Duwwayri, Z. ; Mollaghasemi, Mansooreh
Author_Institution :
i2 Technol., Irving, TX, USA
Volume :
2
fYear :
2001
fDate :
2001
Firstpage :
1208
Abstract :
In this paper, a scheduling heuristic was developed to aid the operators in semiconductor fabs in choosing what type of lots to process next on bottleneck facilities and whether to change machine setup in order to reduce cycle time. The scheduling heuristic aims at balancing workload levels for implanters processing lots at different stages of the wafer production lifecycle. This is accomplished by processing lots that contribute most to increasing inventory levels at the bottleneck facility. A whole production line simulation model was used to evaluate the performance of the scheduling heuristic and to compare it against several commonly used scheduling heuristics with respect to mean cycle time, work in process (WIP), and standard deviation of cycle time. Simulation results showed that the heuristic performed better than all other rules in terms of mean cycle time and WIP in all cases, and better in terms of standard deviation of cycle time for most cases tested
Keywords :
integrated circuit manufacture; ion implantation; production control; production engineering computing; semiconductor process modelling; bottleneck facilities; cycle time; implanter processing; inventory levels; ion implantation; production line simulation model; reentrant flow; scheduling heuristic; scheduling setup changes; semiconductor manufacturing; standard deviation of cycle time; wafer production lifecycle; work in process; workload level balancing; Dispatching; Engineering management; Fabrication; Industrial engineering; Job shop scheduling; Monitoring; Production; Semiconductor device doping; Semiconductor device manufacture; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2001. Proceedings of the Winter
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-7307-3
Type :
conf
DOI :
10.1109/WSC.2001.977435
Filename :
977435
Link To Document :
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