DocumentCode
2121944
Title
Short papers: Quantification of optical deflection by laser-structured ZnO:Al
Author
Berner, Marcel ; Samann, Marc ; Garamoun, Ahmed ; Schubert, Markus B.
Author_Institution
Institute of Photovoltaics, University of Stuttgart, 70569, Germany
fYear
2012
fDate
3-8 June 2012
Firstpage
1
Lastpage
3
Abstract
Anovel camera-based measurement setup fully quantifies the transmitted radiation deflected by textured front electrodes for thin-film solar cells. The conventional measurement of angular intensity distribution only analyzes one polar plane. The new setup examines the optical scattering and/or diffraction over the complete hemisphere. The hemispheric intensity distribution of laser-structured ZnO:Al proves reduced specular transmission and, hence, improved light trapping.
Keywords
Collimators; Laser beams; Lenses; Measurement by laser beam; Optical diffraction; Photovoltaic cells; Semiconductor device measurement; Angular intensity distribution (AID); hemispheric intensity distribution (HID); laser-structured ZnO:Al; optical characterization;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference (PVSC), Volume 2, 2012 IEEE 38th
Conference_Location
Austin, TX, USA
Type
conf
DOI
10.1109/PVSC-Vol2.2012.6656777
Filename
6656777
Link To Document