DocumentCode
2122230
Title
Test-driven development of consumer electronics device drivers: A user-level device driver approach
Author
Seehwan Yoo ; Young-Pil Kim
Author_Institution
Dankook Univ., Cheonan, South Korea
fYear
2015
fDate
9-12 Jan. 2015
Firstpage
392
Lastpage
394
Abstract
Developing device drivers is important for innovative consumer electronics because device driver implements key functionalities of new devices. This paper suggests a test-driven development (TDD) of device drivers, taking advantage of user-level driver. Applying TDD to device drivers is difficult because usually device drivers are implemented inside kernel, and are tightly coupled with complex kernel driver framework, which hinders driver developers from using TDD. Therefore, testing the device driver mostly focused on interaction with the rest of the kernel, rather than the device operations. Recent user-level device driver separates device drivers from the kernel. Thus, we can easily apply TDD on device drivers, circumventing complex kernel operations, and focusing on device operations. In addition, we can effectively enlarge testing coverage, enhancing software quality.
Keywords
consumer electronics; device drivers; operating system kernels; program testing; TDD; complex kernel driver framework; complex kernel operations; consumer electronics device drivers; device operations; innovative consumer electronics; software quality; test-driven development; user-level device driver approach; user-level driver; Consumer electronics; Hardware; Kernel; Performance evaluation; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Consumer Electronics (ICCE), 2015 IEEE International Conference on
Conference_Location
Las Vegas, NV
Print_ISBN
978-1-4799-7542-6
Type
conf
DOI
10.1109/ICCE.2015.7066459
Filename
7066459
Link To Document