• DocumentCode
    2122230
  • Title

    Test-driven development of consumer electronics device drivers: A user-level device driver approach

  • Author

    Seehwan Yoo ; Young-Pil Kim

  • Author_Institution
    Dankook Univ., Cheonan, South Korea
  • fYear
    2015
  • fDate
    9-12 Jan. 2015
  • Firstpage
    392
  • Lastpage
    394
  • Abstract
    Developing device drivers is important for innovative consumer electronics because device driver implements key functionalities of new devices. This paper suggests a test-driven development (TDD) of device drivers, taking advantage of user-level driver. Applying TDD to device drivers is difficult because usually device drivers are implemented inside kernel, and are tightly coupled with complex kernel driver framework, which hinders driver developers from using TDD. Therefore, testing the device driver mostly focused on interaction with the rest of the kernel, rather than the device operations. Recent user-level device driver separates device drivers from the kernel. Thus, we can easily apply TDD on device drivers, circumventing complex kernel operations, and focusing on device operations. In addition, we can effectively enlarge testing coverage, enhancing software quality.
  • Keywords
    consumer electronics; device drivers; operating system kernels; program testing; TDD; complex kernel driver framework; complex kernel operations; consumer electronics device drivers; device operations; innovative consumer electronics; software quality; test-driven development; user-level device driver approach; user-level driver; Consumer electronics; Hardware; Kernel; Performance evaluation; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ICCE), 2015 IEEE International Conference on
  • Conference_Location
    Las Vegas, NV
  • Print_ISBN
    978-1-4799-7542-6
  • Type

    conf

  • DOI
    10.1109/ICCE.2015.7066459
  • Filename
    7066459