DocumentCode :
2122803
Title :
Measuring of dielectric properties by microstrip resonators in the GHz frequency
Author :
Rovensky, Tibor ; Pietrikova, Alena ; Vehec, Igor ; Kmec, Martin
Author_Institution :
Department of Technologies in Electronics, Technical University of Kosice, Slovak Republic
fYear :
2015
fDate :
6-10 May 2015
Firstpage :
192
Lastpage :
196
Abstract :
This paper presents analysis of four different (Rogers RO3003C, Rogers RO4403C, Rogers RT/duroid 5880, Rogers RT/duroid RO6010LM) Printed Circuit Boards (PCB) from the dielectric properties point of view in High Frequency (HF) area. Measuring of dielectric properties is provided by ring resonator and T-resonator. Both resonators are designed by self-created software tool and these microstrip structures are applied on PCB by common etching process. Microstrip resonators are designed to provide numerous data points over a broad frequency range. Fabricated resonators are measured by combination of Vector Network Analyser (VNA) and test probe station. Measured scattering parameters are used as input parameters for calculating dielectric constant and Q factor of measured dielectric substrate. Determined dielectric properties are plotted in graphs in frequency range from 1 GHz to 10 GHz.
Keywords :
Dielectric constant; Dielectric measurement; Frequency measurement; Q-factor; Resonant frequency; Substrates;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Technology (ISSE), 2015 38th International Spring Seminar on
Conference_Location :
Eger, Hungary
Type :
conf
DOI :
10.1109/ISSE.2015.7247988
Filename :
7247988
Link To Document :
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