• DocumentCode
    2122888
  • Title

    Troubleshooting of 3G LTE mobility parameters using iterative statistical model refinement

  • Author

    Tiwana, Moazzam Islam ; Sayrac, Berna ; Altman, Zwi ; Chahed, Tijani

  • Author_Institution
    Orange Labs., RESA/NET, Issy-Les-Moulineaux, France
  • fYear
    2009
  • fDate
    15-17 Dec. 2009
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents a new troubleshooting methodology for 3G Long Term Evolution (LTE) networks based on a closed-form expression between Radio Resource Management (RRM) and Key Performance Indicator (KPI) parameters, using statistical learning. This methodology aims at locally optimising the RRM parameters of the cells with poor performance in an iterative manner. The optimization engine uses the closed-form relationship to calculate the optimized RRM parameters for these cells. The main advantage of this methodolgy is the small number of iterations required to achieve convergence and the QoS objective. A troubleshooting application scenario involving mobility in LTE networks is considered. Numerical simulations illustrate the benefits of our proposed scheme.
  • Keywords
    3G mobile communication; iterative methods; mobility management (mobile radio); optimisation; statistical analysis; 3G LTE mobility parameters; KPI parameters; QoS objective; RRM parameters; closed-form expression; convergence; iterative statistical model refinement; key performance indicator; local optimisation; long term evolution networks; numerical simulations; radio resource management; troubleshooting methodology; 3G mobile communication; Bayesian methods; Closed-form solution; Degradation; Iterative methods; Linear regression; Long Term Evolution; Optimization methods; Resource management; Statistical learning; LTE; Statistical learning; automated troubleshooting; handover margin; linear regression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Days (WD), 2009 2nd IFIP
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4244-5660-4
  • Electronic_ISBN
    978-1-4244-5662-8
  • Type

    conf

  • DOI
    10.1109/WD.2009.5449704
  • Filename
    5449704