• DocumentCode
    2123097
  • Title

    Sensitivity of point defects in one dimensional nanocircuits

  • Author

    Hunt, Steven R. ; Hoang, Phuc D. ; Khalap, Vaikunth R. ; Wan, Danny ; Corso, Brad L. ; Collins, Philip G.

  • Author_Institution
    Dept. of Phys. & Astron., Univ. of California at Irvine, Irvine, CA, USA
  • fYear
    2010
  • fDate
    1-4 Nov. 2010
  • Firstpage
    2623
  • Lastpage
    2628
  • Abstract
    When tailored to contain a single resistive defect, one dimensional nanocircuits can realize high dynamic range, high bandwidth transduction of single molecule chemical events. The physical mechanisms behind this sensitive transduction, however, remain poorly understood. Here, we complement ongoing sensing measurements with scanning probe characterization of the electronic properties of defects. The high sensitivity of defect sites is directly probed, and is found to be in excellent agreement with a finite element model containing realistic device parameters for the defect sites. The model illuminates the most likely sensing mechanisms of these single molecule circuits, and fully supports the premise that further tailoring of the defect sites could enable the chemically selective interrogation of a wide range of complex molecular interactions.
  • Keywords
    chemical sensors; finite element analysis; molecular electronics; nanoelectronics; point defects; sensitivity analysis; bandwidth transduction; electronic property; finite element model; molecular interactions; one dimensional nanocircuits; point defect sensitvity; scanning probe characterization; sensing measurements; single molecule chemical events; single molecule circuits; single resistive defect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2010 IEEE
  • Conference_Location
    Kona, HI
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-8170-5
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2010.5690224
  • Filename
    5690224