Functional tests for ring-address SRAM-type FIFOs

Author

Van de Goor, Ad J. ; Zorian, Yervant ; Schanstra, Ivo

Author_Institution

Delft Univ. of Technol., Netherlands

fYear

1994

fDate

28 Feb-3 Mar 1994

Firstpage

666

Abstract

First-In-First-Out (FTFO) memories are becoming increasingly popular as buffer storage between subsystems operating at different data rates. One way to implement a FIFO is to use a dual-port SRAM memory with a ring-address mechanism consisting of an n-bit shift register (n is the number of words in the FIFO). This saves the address decoder circuitry and allows for higher speed operation, which makes this type of FIFO very popular, especially for embedded applications. The well-known functional tests for SRAMs cannot be applied to FIFOs, because of their built-in access restrictions. Functional fault models and functional tests for ring-address SRAM-type FIFOs have not been documented before; this paper aims at filling in this gap. It introduces functional fault models and presents a set of tests for ring-address SRAM-type FIFOs

Keywords

SRAM chips; buffer storage; fault location; integrated circuit testing; SRAM-type FIFOs; address decoder circuitry; buffer storage; dual-port SRAM memory; embedded applications; first-in-first-out memories; functional fault models; functional tests; n-bit shift register; ring-address; Buffer storage; Circuit faults; Circuit testing; Decoding; Filling; Logic arrays; Logic circuits; Logic testing; Random access memory; Shift registers;

fLanguage

English

Publisher

ieee

Conference_Titel

European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.

Conference_Location

Paris

Print_ISBN

0-8186-5410-4

Type

conf

DOI

10.1109/EDTC.1994.326797

Filename

326797