Title :
Functional tests for ring-address SRAM-type FIFOs
Author :
Van de Goor, Ad J. ; Zorian, Yervant ; Schanstra, Ivo
Author_Institution :
Delft Univ. of Technol., Netherlands
fDate :
28 Feb-3 Mar 1994
Abstract :
First-In-First-Out (FTFO) memories are becoming increasingly popular as buffer storage between subsystems operating at different data rates. One way to implement a FIFO is to use a dual-port SRAM memory with a ring-address mechanism consisting of an n-bit shift register (n is the number of words in the FIFO). This saves the address decoder circuitry and allows for higher speed operation, which makes this type of FIFO very popular, especially for embedded applications. The well-known functional tests for SRAMs cannot be applied to FIFOs, because of their built-in access restrictions. Functional fault models and functional tests for ring-address SRAM-type FIFOs have not been documented before; this paper aims at filling in this gap. It introduces functional fault models and presents a set of tests for ring-address SRAM-type FIFOs
Keywords :
SRAM chips; buffer storage; fault location; integrated circuit testing; SRAM-type FIFOs; address decoder circuitry; buffer storage; dual-port SRAM memory; embedded applications; first-in-first-out memories; functional fault models; functional tests; n-bit shift register; ring-address; Buffer storage; Circuit faults; Circuit testing; Decoding; Filling; Logic arrays; Logic circuits; Logic testing; Random access memory; Shift registers;
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-5410-4
DOI :
10.1109/EDTC.1994.326797
