DocumentCode :
2123452
Title :
Sources for cadmium diffusion in InP kinetics in short duration anneals
Author :
Bulusu, D.V. ; Chang, C.C. ; Derkits, G.E. ; Geva, M. ; Lee, K.M. ; Resta, R.A. ; Tai, C.Y. ; Zolnowski, D.R.
Author_Institution :
Optoelectron. Center, Lucent Technol., Breinigsville, PA, USA
fYear :
2000
fDate :
2000
Firstpage :
174
Lastpage :
177
Abstract :
Short duration cadmium diffusion in sealed ampoules was studied at a temperature of 550°C and a Cd/P molar ratio of 0.28. The starting sources were physical mixtures of either elemental Cd metal and red P or Cd3P2 and red P. The Cd profiles were determined by SIMS. In relatively short diffusion anneals up to two hours, the surface concentration, or solubility of Cd with either diffusion source is the same. However, Cd penetration was shallower in samples diffused with elemental (Cd,P) mixture than in samples diffused with (Cd3 P2,P) mixture as the starting source. The slower diffusion of Cd with elemental starting source (Cd,P) appears to be related to the kinetics involved in reaching the thermal equilibrium between CdP2 and CdP4. The formation of Cd3 P2 en route to the eventual formation of CdP2 and CdP4 or surface related kinetics are proposed as plausible mechanisms. The results appear to be consistent with the establishment of thermal equilibrium between CdP2 and CdP4 at a Cd/P ratio of 0.28 per the available phase equilibria data. The diffusion kinetics and defect structure are discussed on the basis of quasi-equilibrium among the three condensed phases InP, CdP2 and CdP4
Keywords :
III-V semiconductors; annealing; cadmium; diffusion; indium compounds; secondary ion mass spectra; 550 degC; Cd penetration; InP:Cd; SIMS; defect structure; quasi-equilibrium; short duration Cd diffusion; short duration anneals; surface concentration; thermal equilibrium; Annealing; Blades; Cadmium; Indium phosphide; Kinetic theory; Temperature dependence; Thermodynamics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
Conference_Location :
Williamsburg, VA
ISSN :
1092-8669
Print_ISBN :
0-7803-6320-5
Type :
conf
DOI :
10.1109/ICIPRM.2000.850260
Filename :
850260
Link To Document :
بازگشت