• DocumentCode
    2123542
  • Title

    Timing analysis of combinational circuits using ADDs

  • Author

    Bahar, R. Iris ; Cho, Hyunwoo ; Hachtel, Gary D. ; Macii, Enrico ; Somenzi, Fabio

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
  • fYear
    1994
  • fDate
    28 Feb-3 Mar 1994
  • Firstpage
    625
  • Lastpage
    629
  • Abstract
    This paper presents a symbolic algorithm to perform timing analysis of combinational circuits which takes advantage of the high compactness of representation of the Algebraic Decision Diagrams (ADDs). The procedure we propose, implemented as on extension of the SIS synthesis system, is able to provide more accurate timing information than any other method presented so far; in particular, it is able to compute and store the true delay of the gate-level representation of the circuit for all possible input vectors, as opposed to the traditional methods which consider only the worst-case primary inputs combination. Furthermore, the approach does not require any explicit false path elimination. The information calculated by the timing analyzer has several practical applications such as determining the sets of critical input vectors, critical gates, and critical paths of the circuit, which may be efficiently used in the process of resynthesizing the network for low-power consumption
  • Keywords
    circuit analysis computing; combinatorial circuits; delays; diagrams; logic CAD; SIS synthesis system; algebraic decision diagrams; combinational circuits; critical gates; critical input vectors; critical paths; gate-level representation; low-power consumption; timing analysis; true delay computation; Circuit analysis; Circuit analysis computing; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Delay estimation; High performance computing; Iris; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-5410-4
  • Type

    conf

  • DOI
    10.1109/EDTC.1994.326813
  • Filename
    326813