DocumentCode
2123542
Title
Timing analysis of combinational circuits using ADDs
Author
Bahar, R. Iris ; Cho, Hyunwoo ; Hachtel, Gary D. ; Macii, Enrico ; Somenzi, Fabio
Author_Institution
Dept. of Electr. & Comput. Eng., Colorado Univ., Boulder, CO, USA
fYear
1994
fDate
28 Feb-3 Mar 1994
Firstpage
625
Lastpage
629
Abstract
This paper presents a symbolic algorithm to perform timing analysis of combinational circuits which takes advantage of the high compactness of representation of the Algebraic Decision Diagrams (ADDs). The procedure we propose, implemented as on extension of the SIS synthesis system, is able to provide more accurate timing information than any other method presented so far; in particular, it is able to compute and store the true delay of the gate-level representation of the circuit for all possible input vectors, as opposed to the traditional methods which consider only the worst-case primary inputs combination. Furthermore, the approach does not require any explicit false path elimination. The information calculated by the timing analyzer has several practical applications such as determining the sets of critical input vectors, critical gates, and critical paths of the circuit, which may be efficiently used in the process of resynthesizing the network for low-power consumption
Keywords
circuit analysis computing; combinatorial circuits; delays; diagrams; logic CAD; SIS synthesis system; algebraic decision diagrams; combinational circuits; critical gates; critical input vectors; critical paths; gate-level representation; low-power consumption; timing analysis; true delay computation; Circuit analysis; Circuit analysis computing; Circuit simulation; Circuit synthesis; Circuit testing; Combinational circuits; Delay estimation; High performance computing; Iris; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location
Paris
Print_ISBN
0-8186-5410-4
Type
conf
DOI
10.1109/EDTC.1994.326813
Filename
326813
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