• DocumentCode
    2123591
  • Title

    Preparation of InP(100) surface for negative electron affinity photocathode

  • Author

    Hafez, M.A. ; Elamrawi, K.A. ; Elsayed-Ali, H.E.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Old Dominion Univ., Norfolk, VA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    Atomic hydrogen cleaning is shown to provide a low temperature cleaning mechanism of InP(100) and produces smooth contaminants free surfaces. Reflection high-energy electron diffraction (RHEED) studies show that the InP(100) is 2×4 reconstructed, phosphorus stabilized surface after hydrogen cleaning at 380-400°C. When thermal cleaning is performed up to the congruent temperature, less clear RHEED patterns are obtained as a result of contamination by oxides and carbon compounds. After hydrogen cleaning, activation to negative electron affinity is performed by the adsorption of cesium and oxygen on the surface. These surfaces produce high quantum efficiency (~8.5%), whereas heat cleaned surfaces produce a quantum efficiency of ~0.1%. Atomic hydrogen cleaning is also shown to be effective in reviving the quantum efficiency of negative electron affinity InP(100) photocathode after its degradation
  • Keywords
    III-V semiconductors; electron affinity; indium compounds; photocathodes; reflection high energy electron diffraction; surface cleaning; surface contamination; surface reconstruction; surface treatment; 2×4; 380 to 400 C; InP; InP(100) surface; RHEED; congruent temperature; high quantum efficiency; negative electron affinity; negative electron affinity photocathode; smooth contaminants; thermal cleaning; Carbon compounds; Cathodes; Cleaning; Diffraction; Electrons; Hydrogen; Reflection; Surface contamination; Surface reconstruction; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
  • Conference_Location
    Williamsburg, VA
  • ISSN
    1092-8669
  • Print_ISBN
    0-7803-6320-5
  • Type

    conf

  • DOI
    10.1109/ICIPRM.2000.850266
  • Filename
    850266