Title :
Next Generation Cross Technology Test Data Solution for M&A
Author :
Khandelwal, Sagar ; Subramanian, Kannan ; Garg, Rohit
Author_Institution :
Cognizant Technol. Solutions, London, UK
Abstract :
Huge merger and acquisition (M&A) activities over the last few years has created large organizations with a wide range of technologies that require complex IT integration programs to support merged business entities. The technology roadmap to reach a final integrated target operating model often includes transition states that involve testing of complex systems environments. One of the key dependencies for successful completion of the software lifecycle is the availability of test data. The challenges in provisioning of test data are not new, however, integration comes with unique challenges such as data migration and intermediate transition states covering a mix of applications from two merging estates. This further increases pressure on the project and test managers to provision and maintain data integrity among all applications to obtain optimum test results. Most data used for testing is created using the below techniques: 1) Direct copy/slice of a production database 2) Create test data using front end applications 3) Populated data into backend components of test system. All of the above test data collection methods have unique constraints and advantages. This paper describes a next-generation approach for creating a cross-technology test data solution implemented during a large IT M&A program at UK banking major.
Keywords :
banking; corporate acquisitions; program testing; IT integration program; United Kingdom banking major; cross technology test data solution; data integrity; information technology; merged business entity; merger-and-acquisition activity; software lifecycle; test data collection method; Data mining; Databases; Manuals; Marketing and sales; Production; Service oriented architecture; Testing; M & A; SOA; Test data; XML; cost; inhouse tools; large bank; time saving;
Conference_Titel :
Information Technology: New Generations (ITNG), 2011 Eighth International Conference on
Conference_Location :
Las Vegas, NV
Print_ISBN :
978-1-61284-427-5
Electronic_ISBN :
978-0-7695-4367-3
DOI :
10.1109/ITNG.2011.61