Effectiveness of a variable sampling time strategy for delay fault diagnosis

Delay fault testing has been an active research topic in the last ten years. Recently proposed methods try to move the sampling time of the circuit outputs during testing to produce better fault coverages than that obtained by using a fixed observation time method. In the same way, the authors propose to use such a testing scheme to improve delay fault diagnosis when compared to methods based on fixed output sampling times. The timing analysis which gives the output observation times applied during the test is first described in this paper. Next, the authors present the diagnosis method they implemented with the new testing scheme. Finally, results showing the effectiveness of a variable sampling time strategy for delay fault diagnosis are given