Title :
Can you deliver the semiconductor devices after performing periodic tests?
Author :
Dragan, Maria ; Bazu, Marius
Author_Institution :
Res. Inst. for Electron. Components (ICCE), Bucharest, Romania
Abstract :
A method to detect the character of a periodic test, destructive or nondestructive, was developed. This method allows the delivery of those semiconductor devices which undergo nondestructive periodic tests. Beneficial effects for the device manufacturers are obvious
Keywords :
nondestructive testing; probability; production testing; semiconductor device manufacture; semiconductor device testing; NDT character determination; nondestructive tests; periodic tests; semiconductor devices; Diodes; Nondestructive testing; Performance evaluation; Production; Resistance heating; Semiconductor device testing; Semiconductor devices; Soldering; Temperature sensors; Voltage;
Conference_Titel :
Semiconductor Conference, 1996., International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3223-7
DOI :
10.1109/SMICND.1996.557415
