Design and characterization of 200-mW-class distributed feedback lasers at 1.55 μm

Author

Sugg, A.R. ; Abeles, J.H. ; Braun, A.M. ; Maiorov, M. ; Menna, R.J. ; DiMarco, L.A. ; Martinelli, R.U. ; Connolly, J.C.

Author_Institution

Sensors Unlimited Inc., Princeton, NJ, USA

fYear

2000

fDate

2000

Firstpage

282

Lastpage

285

Abstract

High-power 1.55-μm distributed feedback lasers for radio-frequency applications have been designed, fabricated and characterized. By employing a broadened-waveguide design in a distributed feedback laser, continuous-wave single-mode performance up to 220 mW has been successfully demonstrated at a heat-sink temperature of -15°C. The average external differential quantum efficiency was 31% over the entire operating range. Single-mode power levels of 162 mW were observed at 15°C. Linewidths of 750 kHz and 1 MHz were measured at power levels of 73 mW and 114 mW, respectively. The relative intensity noise was measurement-limited at a value of -165 dB/Hz at 1 GHz for a power level of 114 mW

Keywords

MOCVD; diffraction gratings; distributed feedback lasers; laser beams; laser feedback; laser modes; laser noise; optical fabrication; semiconductor lasers; vapour phase epitaxial growth; waveguide lasers; -15 C; 1 GHz; 1 MHz; 1.55 mum; 114 mW; 15 C; 162 mW; 220 mW; 31 percent; 73 mW; 750 kHz; average external differential quantum efficiency; broadened-waveguide design; characterization; continuous-wave single-mode performance; distributed feedback laser; distributed feedback lasers; fabrication; heat-sink temperature; high-power distributed feedback lasers; linewidths; measurement-limited noise; operating range; power level; power levels; radio-frequency applications; relative intensity noise; single-mode power levels; Distributed feedback devices; Gratings; Laser feedback; Optical design; Optical noise; Optical waveguides; Power measurement; Radio frequency; Temperature; Waveguide lasers;

fLanguage

English

Publisher

ieee

Conference_Titel

Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on

Conference_Location

Williamsburg, VA

ISSN

1092-8669

Print_ISBN

0-7803-6320-5

Type

conf

DOI

10.1109/ICIPRM.2000.850287

Filename

850287