• DocumentCode
    2124145
  • Title

    Cell height driven transistor sizing in a cell based module design

  • Author

    Lin, How-Rem ; Chou, Ching-Lung ; Hsu, Yu-Chin ; Hwang, Ting-Ting

  • Author_Institution
    Dept. of Comput. Sci., Tsing Hua Univ., Hsin Chu, Taiwan
  • fYear
    1994
  • fDate
    28 Feb-3 Mar 1994
  • Firstpage
    425
  • Lastpage
    429
  • Abstract
    We consider the transistor sizing problem in a module layout which consists of several rows of automatically generated leaf cells based on a new layout style proposed by Hwang et al. (1991). The sizing is performed in two levels. At the module level, a leaf cell is chosen based on a height slack (usable area) and timing slack. At the cell level, the cell is sized based on a width constraint imposed from the module level. The problem of sizing a cell is formulated as a nonlinear program. The objective is to minimize the difference of actual arrival time and the required time of all output nodes simultaneously. A benchmarking process has been conducted at both cell level and module level. Experiments on a set of cells show that on the average over 25% performance improvement is obtained by using 0.06% more area. Moreover, for a leaf cell with multiple outputs, the sizer can indeed simultaneously make the arrival time of all output nodes close to the required time. Results of a module level experiment show that using height slack the maximum delay of the circuit can be reduced up to 17.7% without area penalty for the example shown
  • Keywords
    CMOS integrated circuits; circuit layout CAD; integrated logic circuits; logic CAD; nonlinear programming; C implementation; CMOS digital circuits; actual arrival time; automatically generated leaf cells; benchmarking process; cell based module design; height slack; maximum delay reduction; multiple output leaf cell; nonlinear program; performance driven layout generation; timing optimization; timing slack; transistor sizing problem; width constraint; Circuits; Computer science; Contracts; Data mining; Delay; Design optimization; Logic design; Process design; Rails; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
  • Conference_Location
    Paris
  • Print_ISBN
    0-8186-5410-4
  • Type

    conf

  • DOI
    10.1109/EDTC.1994.326841
  • Filename
    326841