DocumentCode :
2124664
Title :
Multi 6 inch technology for GaAs, GaInP and AlGaInP compounds
Author :
Schmitt, T. ; Deufel, M. ; Strauch, G. ; Schineller, B. ; Heuken, M. ; Juergensen, H.
Author_Institution :
AIXTRON AG, Aachen, Germany
fYear :
2000
fDate :
2000
Firstpage :
357
Lastpage :
360
Abstract :
The increasing demand for high performance, low cost GaAs and InP based devices pushes the MOVPE growth technology towards larger wafer sizes. To meet the industrial requirements we developed the Planetary Reactor concept with the capability to grow on five 6 inch wafers simultaneously. We optimized the growth process for GaAs, GaInP and AlGaInP layers. GaAs/AlAs distributed Bragg reflectors (DBR) were grown as sensitive demonstrators of material quality and homogeneity. The photoluminescence (PL) wavelength and intensity homogeneities as well as thickness mappings and the electrical properties were investigated. Under optimized conditions thickness uniformities of ±0.5% were achieved. GaInP showed wavelength homogeneities of 0.9% with a mean peak wavelength of 652.3 nm measured on a 6" wafer. Six inch AlGaAs/GaInP/AlGaAs test structures exhibited wavelength homogeneities as good as 0.2% with a mean peak wavelength of 689.7 nm. In addition, the maximum precursor efficiency of 54% proves the system adapted for production needs since a considerable reduction of the cost per run can be achieved
Keywords :
III-V semiconductors; MOCVD coatings; aluminium compounds; gallium arsenide; gallium compounds; indium compounds; photoluminescence; semiconductor epitaxial layers; semiconductor growth; vapour phase epitaxial growth; 6 in; 652.3 nm; 689.7 nm; AlGaInP; GaAs; GaInP; MOVPE growth technology; Planetary Reactor concept; distributed Bragg reflectors; electrical properties; high performance; homogeneity; industrial requirements; larger wafer sizes; low cost; material quality; maximum precursor efficiency; multi 6 inch technology; photoluminescence; thickness mappings; Costs; Distributed Bragg reflectors; Epitaxial growth; Epitaxial layers; Extraterrestrial measurements; Gain measurement; Gallium arsenide; Indium phosphide; Inductors; Photoluminescence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 2000. Conference Proceedings. 2000 International Conference on
Conference_Location :
Williamsburg, VA
ISSN :
1092-8669
Print_ISBN :
0-7803-6320-5
Type :
conf
DOI :
10.1109/ICIPRM.2000.850306
Filename :
850306
Link To Document :
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