Title :
Fabrication and electromagnetic characterization of novel self-metallized thin films
Author_Institution :
NASA Langley Research Center
Keywords :
Antenna measurements; Extraterrestrial measurements; Fabrication; Inorganic materials; Metallization; NASA; Optical films; Reflector antennas; Testing; Transistors;
Conference_Titel :
Aerospace Conference, 2003. Proceedings. 2003 IEEE
Print_ISBN :
0-7803-7651-X
DOI :
10.1109/AERO.2003.1235516
