• DocumentCode
    2124827
  • Title

    Bit Error Rate Analysis of jamming for OFDM systems

  • Author

    Jun Luo ; Andrian, Jean H. ; Zhou, Chi

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Florida Int. Univ., University Park, FL
  • fYear
    2007
  • fDate
    26-28 April 2007
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    The bit error rate (BER) analysis of various jamming techniques for orthogonal frequency-division multiplexing (OFDM) systems is given in both analytical form and software simulation results. Specifically, the BER performance of barrage noise jamming (BNJ), partial band jamming (PBJ) and multitone jamming (MTJ) in time-correlated Rayleigh fading channel with additive white gaussian noise (AWGN) has been investigated. In addition, two novel jamming methods - optimal-fraction PBJ and optimal-fraction MTJ for OFDM systems are proposed with detailed theoretical analysis. Simulation results validate the analytical results. It is shown that under the A WGN channel without fading, the optimal-fraction MTJ always gives the best jamming effect among all the jamming techniques given in this paper, while in Rayleigh fading channel the optimal-fraction MTJ can achieve acceptable performance. Both analysis and simulation indicate that the proposed optimal-fraction MTJ can be used to obtain improved jamming effect under various channel conditions with low complexity for OFDM systems.
  • Keywords
    AWGN; OFDM modulation; Rayleigh channels; error statistics; jamming; OFDM systems; additive white Gaussian noise; barrage noise jamming; bit error rate analysis; multitone jamming; orthogonal frequency-division multiplexing systems; partial band jamming; time-correlated Rayleigh fading channel; AWGN; Additive white noise; Analytical models; Bit error rate; Error analysis; Fading; Frequency division multiplexing; Gaussian noise; Jamming; OFDM;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless Telecommunications Symposium, 2007. WTS 2007
  • Conference_Location
    Pomona, CA
  • ISSN
    1934-5070
  • Print_ISBN
    978-1-4244-0696-8
  • Electronic_ISBN
    1934-5070
  • Type

    conf

  • DOI
    10.1109/WTS.2007.4563327
  • Filename
    4563327