Inclusion of Higher Order Diffracted Fields in the Epstein–Peterson Method

A higher order diffracted field calculation to improve the accuracy of a multiple screen diffraction scenario analysis is discussed. In particular, this communication addresses and investigates the accuracy of the Epstein-Peterson prediction method based on the order of the diffracted field used. Theoretical results are compared with diffraction loss measurements, derived from a set of terrain profiles, to demonstrate how the inclusion of the higher order diffracted field significantly improves the accuracy of the Epstein-Peterson method predictions.