DocumentCode :
2125509
Title :
Switched current sigma-delta A/D converter for a CMOS subscriber line analog front end
Author :
Gevaert, Dorine ; Vanneuville, Jozef ; Nedved, Jiri ; Sevenhans, Jan
Author_Institution :
Dept. of Microelectron., KIHWV-Oostende, Belgium
fYear :
1994
fDate :
28 Feb-3 Mar 1994
Firstpage :
75
Lastpage :
79
Abstract :
This paper describes the design and testing of a 1-bit A/D converter based on the sigma-delta modulation principle. Unlike the conventional realisations using the switched capacitor approach, the current switching technique uses the current level as a variable. In order to check the feasibility and advantages of this technique, a first order 1-bit A/D converter and a second order 1-bit A/D converter were designed. In the first order 1-bit A/D converter a time-continuous current-integrator is used as filter. The circuit has been designed realised and tested. In the second order 1-bit A/D converter the filter is based on the analog sampling and processing of a current signal. The second order filter is implemented with class AB switched current memory cells. The design has been simulated and processed in ES2 1.5 μm CMOS technology
Keywords :
CMOS integrated circuits; analogue processing circuits; analogue-digital conversion; delta modulation; integrating circuits; linear integrated circuits; switched networks; 1-bit A/D converter; CMOS subscriber line analog front end; ES2 1.5 μm CMOS technology; SI integrator; analog current signal processing; analog sampling; class AB switched current memory cells; current switching technique; first order ADC; power spectral density; second order ADC; sigma-delta modulation; switched current sigma-delta A/D converter; time-continuous current-integrator filter; CMOS process; CMOS technology; Capacitors; Circuit simulation; Circuit testing; Delta-sigma modulation; Filters; Signal processing; Signal sampling; Switching converters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
European Design and Test Conference, 1994. EDAC, The European Conference on Design Automation. ETC European Test Conference. EUROASIC, The European Event in ASIC Design, Proceedings.
Conference_Location :
Paris
Print_ISBN :
0-8186-5410-4
Type :
conf
DOI :
10.1109/EDTC.1994.326895
Filename :
326895
Link To Document :
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