• DocumentCode
    21256
  • Title

    Introduction to the Special Section

  • Author

    Ottavi, Marco ; Park, Nahea

  • Author_Institution
    University of Rome “Tor Vergata”, Department of Electronic Engineering, 00133 Rome, Italy
  • Volume
    12
  • Issue
    4
  • fYear
    2013
  • fDate
    Jul-13
  • Firstpage
    475
  • Lastpage
    476
  • Abstract
    The five papers in this special section on defect and fault tolerance in VLSI and nanotechnology systems cover a wide spectrum of techniques, which are encountered in the design of defect and fault tolerance in nanoscale circuits and systems.
  • Keywords
    Aging; Circuit faults; Fault detection; Fault tolerance; Nanoscale devices; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2013.2262732
  • Filename
    6552880
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=21256