Title :
Technique for controlling effective Vth in multi-Gbit DRAM sense amplifier
Author :
Saito, M. ; Ogawa, J. ; Gotoh, K. ; Kawashima, S. ; Tamura, H.
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
Abstract :
We propose the use of a capacitor couple structure to control the effective threshold voltage (Vth) and its application to Vth fluctuation compensation in flip-flop sense amplifiers for multi-gigabit DRAMs. Our proposed sense amplifier functions correctly at up to a 500 mV fluctuation in Vth for the transistor pair in the latch. It does not require extra charging time in the sensing operation for compensation. In addition, the sense-amplifier speed is independent of the Vth value, so our S/A can also compensate the sensing speed fluctuation. This Vth control method and Vth-compensated sense amplifier opens up the possibility of utilizing transistors with gate lengths of less than 0.1 /spl mu/m, where the Vth variations could not be reduced.
Keywords :
DRAM chips; amplifiers; flip-flops; voltage control; capacitor couple; flip-flop sense amplifier; fluctuation compensation; latch; multi-gigabit DRAM; threshold voltage control; Capacitors; Flip-flops; Fluctuations; Random access memory; Threshold voltage; Voltage control;
Conference_Titel :
VLSI Circuits, 1996. Digest of Technical Papers., 1996 Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-3339-X
DOI :
10.1109/VLSIC.1996.507732