Title :
A 300mV Sub-1pJ differential 6T sub-threshold SRAM with low energy and variability resilient local assist circuit
Author :
Lih-Yih Chiou ; Chi-Ray Huang ; Chang-Chieh Cheng ; Yu-Lin Tsai
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
Lowering supply voltage from super-threshold to sub-threshold is a promising approach for ultra-low energy applications. However, the degraded cell stability limits the voltage scalability of the conventional 6T SRAM. In this paper, we proposed a novel local assist circuitry that enables low energy and variability resilient operation at ultra-low voltages for differential sub-threshold SRAM design. The process variation tolerant local sense amplifier and charge-sharing based precharge scheme are utilized to ensure the read stability at ultra-low voltage region. A 16kb 6T SRAM marco is implemented in 90nm CMOS technology to demonstrate the functionality of our proposed local assist circuits. Its minimum energy consumption is 0.624pJ/access, operating at 26.3MHz and 400mV.
Keywords :
CMOS memory circuits; SRAM chips; amplifiers; integrated circuit design; 6T SRAM marco; CMOS technology; charge-sharing based precharge scheme; degraded cell stability limits; differential 6T subthreshold SRAM design; frequency 26.3 MHz; low-energy variability-resilient local assist circuit; process variation tolerant local sense amplifier; read stability; size 90 nm; ultralow-energy applications; voltage 300 mV; voltage 400 mV; voltage scalability; Circuit stability; Computer architecture; Energy consumption; Microprocessors; Random access memory; Stability analysis; Transistors; SRAM; local assist; process variations; subthreshold; ultra low energy;
Conference_Titel :
Next-Generation Electronics (ISNE), 2013 IEEE International Symposium on
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-4673-3036-7
DOI :
10.1109/ISNE.2013.6512360