Title :
"1 Thru+2.5 Reflects": A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures
Author :
Wan, Changhua ; Nauwelears, Bart ; De Raedt, Walter ; Van Rossum, Marc
Author_Institution :
Departement Elektrotechniek, Katholieke Universiteit Leuven, Kardinaal Mercierlaan 94, 3001 Heverlee, Belgium. Phone: 32-16-321117, Fax: 32-16-32198,6, E-mail: changhua.wan@esat.kuleuven.ac.be
Abstract :
A new de-embedding technique using three planar standards of the same length is developed, which for the first time makes it feasible to de-embed MIC/MMIC device measurements with a fixed-length, shielded test fixture. One standard is a thru line and the other two provide three reflective loads. Complete de-embedding only requires the "Thru" measurement and two and a half "Reflect" measurements. All the standards are easy to realize using MIC/MMIC processing techniques. The theory is verified by numerical simulations.
Keywords :
Fixtures; Length measurement; MMICs; Measurement standards; Microstrip; Microwave integrated circuits; Propagation constant; Reflection; Scattering parameters; Superconducting microwave devices;
Conference_Titel :
Microwave Conference, 1996. 26th European
Conference_Location :
Prague, Czech Republic
DOI :
10.1109/EUMA.1996.337546
