• DocumentCode
    2126324
  • Title

    Measurement of the frequency dependence of a single-electron tunneling capacitance standard

  • Author

    Eichenberger, A.L. ; Keller, M.W. ; Martinis, J.M. ; Zimmerman, N.M.

  • Author_Institution
    Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    2000
  • fDate
    14-19 May 2000
  • Firstpage
    16
  • Lastpage
    17
  • Abstract
    In the context of a proposed new capacitance standard based on counting electrons, we discuss a method to investigate its frequency dependence. We describe measurements of this frequency dependence using a technique that involves the same single-electron tunneling devices used in the capacitance standard.
  • Keywords
    Capacitance measurement; Electrometers; Measurement standards; Single electron transistors; Tunneling; capacitance standard; counting electrons; cryogenic vacuum gap capacitor; electron pump; frequency dependence; single-electron tunneling; transistor electrometer; Capacitance measurement; Capacitors; Electrons; Frequency dependence; Frequency measurement; Measurement standards; Monitoring; Switches; Tunneling; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 2000 Conference on
  • Conference_Location
    Sydney, NSW, Australia
  • Print_ISBN
    0-7803-5744-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2000.850853
  • Filename
    850853
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2126324