Title :
Measurement of the frequency dependence of a single-electron tunneling capacitance standard
Author :
Eichenberger, A.L. ; Keller, M.W. ; Martinis, J.M. ; Zimmerman, N.M.
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
In the context of a proposed new capacitance standard based on counting electrons, we discuss a method to investigate its frequency dependence. We describe measurements of this frequency dependence using a technique that involves the same single-electron tunneling devices used in the capacitance standard.
Keywords :
Capacitance measurement; Electrometers; Measurement standards; Single electron transistors; Tunneling; capacitance standard; counting electrons; cryogenic vacuum gap capacitor; electron pump; frequency dependence; single-electron tunneling; transistor electrometer; Capacitance measurement; Capacitors; Electrons; Frequency dependence; Frequency measurement; Measurement standards; Monitoring; Switches; Tunneling; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850853
