DocumentCode
2126336
Title
Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves
Author
Caddemi, A. ; Paola, A. Di ; Sannino, M.
Author_Institution
Dipartimento di Ingegneria Elettrica, UniversitÃ\xa0 di Palermo, Viale delle Scienze, 90128 Palermo, Italy
Volume
1
fYear
1996
fDate
6-13 Sept. 1996
Firstpage
186
Lastpage
190
Abstract
The good performances of a set-up for the complete characterization of HEMTs up to 40 Ghz in terms of noise and scattering parameters through noise figure measurements only are shown by many experimental results. Because of some inconveniences in practice the use of the method is suggested for research laboratories only. For industrial applications an alternative symplified method is proposed whose performances are shown to be in surprising agreement with the ones of the standard method.
Keywords
Circuit noise; HEMTs; MODFETs; Microwave measurements; Microwave theory and techniques; Noise figure; Noise generators; Noise measurement; Particle measurements; Performance evaluation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1996. 26th European
Conference_Location
Prague, Czech Republic
Type
conf
DOI
10.1109/EUMA.1996.337549
Filename
4138604
Link To Document