• DocumentCode
    2126336
  • Title

    Comparison between two measuring methods for complete characterization of low-noise HEMTs at microwaves

  • Author

    Caddemi, A. ; Paola, A. Di ; Sannino, M.

  • Author_Institution
    Dipartimento di Ingegneria Elettrica, UniversitÃ\xa0 di Palermo, Viale delle Scienze, 90128 Palermo, Italy
  • Volume
    1
  • fYear
    1996
  • fDate
    6-13 Sept. 1996
  • Firstpage
    186
  • Lastpage
    190
  • Abstract
    The good performances of a set-up for the complete characterization of HEMTs up to 40 Ghz in terms of noise and scattering parameters through noise figure measurements only are shown by many experimental results. Because of some inconveniences in practice the use of the method is suggested for research laboratories only. For industrial applications an alternative symplified method is proposed whose performances are shown to be in surprising agreement with the ones of the standard method.
  • Keywords
    Circuit noise; HEMTs; MODFETs; Microwave measurements; Microwave theory and techniques; Noise figure; Noise generators; Noise measurement; Particle measurements; Performance evaluation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1996. 26th European
  • Conference_Location
    Prague, Czech Republic
  • Type

    conf

  • DOI
    10.1109/EUMA.1996.337549
  • Filename
    4138604