Title :
A new Bulk Built-In Current Sensing circuit for single-event transient detection
Author :
Zhang, Zhichao ; Wang, Tao ; Chen, Li ; Yang, Jinsheng
Author_Institution :
Electr. & Comput. Eng., Univ. of Saskatchewan, Saskatoon, SK, Canada
Abstract :
This paper introduces a new design for the Bulk Built-In Current Sensor (BICS) capable of detecting the single-event transients (SET) due to a particle strike in the integrated circuits. An 4-bit multiplier is used as a case study. The simulation results indicate that efficiency and applicability of the Bulk-BICS of this work improves while the power consumption and area overhead reduce greatly.
Keywords :
built-in self test; logic design; multiplying circuits; BICS; SET; bulk built-in current sensing circuit; bulk built-in current sensor; integrated circuits; multiplier circuit; single-event transient detection; Artificial neural networks; Latches; MOSFETs; Neodymium; Simulation; Transient analysis; area overhead; built-in current sensor; power consumption; single-event transient (SET);
Conference_Titel :
Electrical and Computer Engineering (CCECE), 2010 23rd Canadian Conference on
Conference_Location :
Calgary, AB
Print_ISBN :
978-1-4244-5376-4
Electronic_ISBN :
0840-7789
DOI :
10.1109/CCECE.2010.5575124
