DocumentCode :
2127808
Title :
Structural effects in electrical conductivity of SnO2 thin films
Author :
Ivashchenko, Anatolii ; Kerner, Lacov
Author_Institution :
Inst. of Appl. Phys., Acad. of Sci., Kishinev, Moldova
Volume :
2
fYear :
1997
fDate :
7-11 Oct 1997
Firstpage :
451
Abstract :
Electrical conductivity in SnO2 thin films is studied within the framework of percolation theory. To improve the agreement between experiment and theory the effect of film microstructure was taken into account by chose the uniform function for energy distribution of intergrain barrier heights
Keywords :
crystal microstructure; electrical conductivity; percolation; semiconductor thin films; tin compounds; SnO2; SnO2 thin films; electrical conductivity; energy distribution; film microstructure; intergrain barrier heights; percolation theory; structural effects; Conductivity; Crystallization; Resistors; Temperature; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Conference, 1997. CAS '97 Proceedings., 1997 International
Conference_Location :
Sinaia
Print_ISBN :
0-7803-3804-9
Type :
conf
DOI :
10.1109/SMICND.1997.651244
Filename :
651244
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2127808
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