DocumentCode
2127891
Title
Bulk and edge phenomena in AC quantum Hall effect?
Author
Schurr, J. ; Melcher, J. ; von Campenhausen, A. ; Pierz, K. ; Hein, G. ; Ahlers, F.-J.
Author_Institution
Phys. Tech. Bundesanstalt, Braunschweig, Germany
fYear
2000
fDate
14-19 May 2000
Firstpage
154
Lastpage
155
Abstract
We investigated the AC quantum Hall effect of several GaAs-based samples. The influence of temperature, current, and frequency was measured and seems to be caused by bulk and edge phenomena.
Keywords
Bridge circuits; Electric resistance measurement; Gallium arsenide; Measurement standards; Quantum Hall effect; AC quantum Hall effect; GaAs; GaAs-based samples; bulk phenomena; coaxial bridge; current influence; edge phenomena; frequency influence; resistance measurement; temperature influence; Bridge circuits; Current measurement; Electrical resistance measurement; Frequency; Hall effect; Impedance; Resistors; Shape measurement; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.850924
Filename
850924
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