DocumentCode :
2127922
Title :
A generalised treatment of the calibration and measurement for vector indicating microwave reflectometers
Author :
Cox, M.G. ; Dainton, M.P. ; Harris, P.M. ; Ridler, N.M. ; Young, P.R.
Author_Institution :
Nat. Phys. Lab., Teddington, UK
fYear :
2000
fDate :
14-19 May 2000
Firstpage :
160
Lastpage :
161
Abstract :
This paper gives a generalised treatment of the calibration and measurement of vector-indicating microwave reflectometers. The reflection coefficient is treated as a complex measurand with an elliptical region of uncertainty. The reflectometer calibration is treated as (i) a deterministic problem, and (ii) an overdetermined problem employing generalised distance regression.
Keywords :
Calibration; Covariance analysis; Covariance matrices; Jacobian matrices; Microwave reflectometry; Network analyzers; Reflectometers; Jacobian matrix; complex measurand; covariance matrix; deterministic problem; elliptical region of uncertainty; generalised distance regression; overdetermined problem; reflection coefficient; reflectometer calibration; vector-indicating microwave reflectometers; Calibration; Covariance matrix; Equations; Joining processes; Laboratories; Linear systems; Matrices; Microwave measurements; Reflection; Uncertainty;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
Type :
conf
DOI :
10.1109/CPEM.2000.850927
Filename :
850927
Link To Document :
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