DocumentCode
2128161
Title
Stochastic analysis for interconnect channels
Author
Gao, Cong ; Shen, Jianxiang ; Chen, Ji
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Houston, Houston, TX, USA
fYear
2012
fDate
8-14 July 2012
Firstpage
1
Lastpage
2
Abstract
This paper presents an efficient way to characterize the channel properties due to uncertainties. Sparse grid based stochastic collocation method is applied to the finite difference time domain (FDTD) method for analyzing transmission line structure. Both geometry and signal clock uncertainties are considered in the simulation.
Keywords
finite difference time-domain analysis; interconnections; microstrip lines; stochastic processes; transmission lines; FDTD method; channel properties; finite difference time domain method; interconnect channels; signal clock uncertainties; sparse grid-based stochastic collocation method; stochastic analysis; transmission line structure; Finite difference methods; Microstrip; Power transmission lines; Standards; Stochastic processes; Time domain analysis; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location
Chicago, IL
ISSN
1522-3965
Print_ISBN
978-1-4673-0461-0
Type
conf
DOI
10.1109/APS.2012.6348013
Filename
6348013
Link To Document