Title :
Stability tests of three cryo-cooled sapphire oscillators
Author :
Wang, R.T. ; Dick, G.J.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
We present frequency stability and phase noise results of three cryo-cooled sapphire oscillators. Technical designs include cryocooler integration, compensated sapphire/ruby combination, and new receiver with Pound frequency lock circuit.
Keywords :
cooling; dielectric resonator oscillators; frequency stability; frequency standards; low-temperature techniques; microwave measurement; phase noise; sapphire; Al/sub 2/O/sub 3/; Pound frequency lock circuit; compensated sapphire/ruby combination; cryo-cooled sapphire oscillators; cryocooler integration; frequency stability; frequency standard; local oscillator performance; phase noise; quality factor; turnover temperature; Circuit stability; Frequency measurement; Helium; Noise measurement; Oscillators; Phase measurement; Phase noise; Temperature; Testing; Vibration measurement;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850940
