Diagnosing an analog feedback system using model-based reasoning

The approach developed by J. de Kleer and B.C. Williams (1987) has been extended to diagnose steady-state faults in an analog feedback system. A prototype system called AMFI (automated model-based fault isolation) is described which automatically diagnoses a target system given only information on the connectivity and component transfer functions. The prototype detects inconsistencies among measurements, calculates single- and multiple-fault hypotheses and their probabilities, and suggests the best next measurement