Title :
Diagnosing an analog feedback system using model-based reasoning
Author :
Tong, David W. ; Walther, Eckart ; Zalondek, Kevin C.
Author_Institution :
General Electric Co., Schenectady, NY, USA
Abstract :
The approach developed by J. de Kleer and B.C. Williams (1987) has been extended to diagnose steady-state faults in an analog feedback system. A prototype system called AMFI (automated model-based fault isolation) is described which automatically diagnoses a target system given only information on the connectivity and component transfer functions. The prototype detects inconsistencies among measurements, calculates single- and multiple-fault hypotheses and their probabilities, and suggests the best next measurement
Keywords :
automatic testing; control engineering computing; expert systems; feedback; maintenance engineering; AMFI; analog feedback system; automated model-based fault isolation; component transfer functions; connectivity; diagnostic system; model-based reasoning; multiple-fault hypotheses; steady-state faults; Artificial intelligence; Circuit faults; Feedback loop; Humans; Inference mechanisms; Prototypes; Research and development; State feedback; Steady-state; Transfer functions;
Conference_Titel :
AI Systems in Government Conference, 1989.,Proceedings of the Annual
Conference_Location :
Washington, DC
Print_ISBN :
0-8186-1934-1
DOI :
10.1109/AISIG.1989.47337
