• DocumentCode
    2128769
  • Title

    350-nm band edge-emitting laser diodes enabled by low-dislocation-density AlGaN templates

  • Author

    Crawford, Mary H. ; Allerman, Andrew A. ; Armstrong, Andrew M. ; Wierer, Jonathan J. ; Chow, Weng W. ; Moseley, Michael W. ; Smith, Michael L. ; Cross, Karen C.

  • Author_Institution
    Sandia National Laboratories, Albuquerque, NM, USA
  • fYear
    2015
  • fDate
    13-15 July 2015
  • Firstpage
    121
  • Lastpage
    122
  • Abstract
    Realization of efficient laser diodes with ultra-violet (UV) emission from ∼260–360 nm would enable many applications including fluorescence-based biological agent detection, sterilization, and portable water purification. While InGaN-based laser diodes are well developed down to ∼370 nm, achieving shorter UV wavelengths requires higher Al-content AlGaN alloys with increasing challenges in achieving p-type doping, strain-management, and low threading-dislocation-density (TDD) AlGaN templates. Given these challenges, few groups have reported AlGaN-based edge-emitting laser diodes (LDs) with emission < 355 nm.[1, 2] Most recently, random lasing via Anderson localization in AlGaN nanowire structures has demonstrated a novel approach to realizing deep-UV laser diodes.[3]
  • Keywords
    Aluminum gallium nitride; Diode lasers; Gallium nitride; Laboratories; Optical waveguides; Wide band gap semiconductors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Summer Topicals Meeting Series (SUM), 2015
  • Conference_Location
    Nassau, Bahamas
  • Print_ISBN
    978-1-4799-7467-2
  • Type

    conf

  • DOI
    10.1109/PHOSST.2015.7248224
  • Filename
    7248224