Title :
Recent developments in BIPM voltage standard comparisons
Author :
Reymann, D. ; Witt, T.J. ; Vrabcek, P. ; Tang, Y.H. ; Hamilton, C.A. ; Katkov, A. ; Mendeleyev, D.I. ; Jeanneret, B. ; Power, O.
Author_Institution :
Bur. Int. des Poids et Mesures, Sevres, France
Abstract :
The BIPM carries out a number of comparisons of DC voltage standards with national metrology institutes. These take the form of on-site comparisons of Josephson standards or bilateral comparisons using travelling standards based on Zener diodes. This paper describes some of the new procedures used in both types of comparisons and presents some results of five recent BIPM key comparisons.
Keywords :
Josephson effect; Zener diodes; transfer standards; voltage measurement; BIPM key comparisons; BIPM voltage standard; DC voltage standards; Josephson standards; Zener diodes; bilateral comparisons; national metrology institutes; on-site comparisons; travelling standards; Calibration; Diodes; Laboratories; Metrology; NIST; Region 8; Standards development; Temperature; Uncertainty; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850972
