DocumentCode
2129086
Title
Recent developments in BIPM voltage standard comparisons
Author
Reymann, D. ; Witt, T.J. ; Vrabcek, P. ; Tang, Y.H. ; Hamilton, C.A. ; Katkov, A. ; Mendeleyev, D.I. ; Jeanneret, B. ; Power, O.
Author_Institution
Bur. Int. des Poids et Mesures, Sevres, France
fYear
2000
fDate
14-19 May 2000
Firstpage
253
Lastpage
254
Abstract
The BIPM carries out a number of comparisons of DC voltage standards with national metrology institutes. These take the form of on-site comparisons of Josephson standards or bilateral comparisons using travelling standards based on Zener diodes. This paper describes some of the new procedures used in both types of comparisons and presents some results of five recent BIPM key comparisons.
Keywords
Josephson effect; Zener diodes; transfer standards; voltage measurement; BIPM key comparisons; BIPM voltage standard; DC voltage standards; Josephson standards; Zener diodes; bilateral comparisons; national metrology institutes; on-site comparisons; travelling standards; Calibration; Diodes; Laboratories; Metrology; NIST; Region 8; Standards development; Temperature; Uncertainty; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.850972
Filename
850972
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