DocumentCode
2129122
Title
Interlaboratory comparison of Josephson Voltage Standards (JVS) between NIST and Lockheed Martin Astronautics (LMA)
Author
Tang, Y.H. ; Miller, W.B.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2000
fDate
14-19 May 2000
Firstpage
257
Lastpage
258
Abstract
Two JVS systems operated at NIST and LMA were compared by using four travelling Zener standards. A MBP protocol was adopted for the comparison. The mean difference between the measurements of the two laboratories was found to be 0.059 /spl mu/V with an expanded uncertainty of /spl plusmn/0.218 /spl mu/V with 95% confidence.
Keywords
Josephson effect; Zener diodes; laboratories; transfer standards; voltage measurement; 0.059 /spl mu/V; 0.059 muV; Josephson voltage standards; Lockheed Martin Astronautics; MBP protocol; NIST; interlaboratory comparison; travelling Zener standards; uncertainty; Atmospheric measurements; Data analysis; Extraterrestrial measurements; Laboratories; Measurement standards; NIST; Performance evaluation; Pressure measurement; Switches; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location
Sydney, NSW, Australia
Print_ISBN
0-7803-5744-2
Type
conf
DOI
10.1109/CPEM.2000.850974
Filename
850974
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