Title :
Interlaboratory comparison of Josephson Voltage Standards (JVS) between NIST and Lockheed Martin Astronautics (LMA)
Author :
Tang, Y.H. ; Miller, W.B.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Two JVS systems operated at NIST and LMA were compared by using four travelling Zener standards. A MBP protocol was adopted for the comparison. The mean difference between the measurements of the two laboratories was found to be 0.059 /spl mu/V with an expanded uncertainty of /spl plusmn/0.218 /spl mu/V with 95% confidence.
Keywords :
Josephson effect; Zener diodes; laboratories; transfer standards; voltage measurement; 0.059 /spl mu/V; 0.059 muV; Josephson voltage standards; Lockheed Martin Astronautics; MBP protocol; NIST; interlaboratory comparison; travelling Zener standards; uncertainty; Atmospheric measurements; Data analysis; Extraterrestrial measurements; Laboratories; Measurement standards; NIST; Performance evaluation; Pressure measurement; Switches; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 2000 Conference on
Conference_Location :
Sydney, NSW, Australia
Print_ISBN :
0-7803-5744-2
DOI :
10.1109/CPEM.2000.850974
